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This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
  • ISBN13: 9780195092042
  • Publisher: Oxford University Press, USA
  • Pubilcation Year: 1994
  • Format: Hardcover
  • Pages: 00284
SeriesOxford Series in Optical & Imaging Sciences
Publication DateJuly 1, 1994
Primary CategoryScience/Microscopes & Microscopy

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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